Proceedings 1992 Annual Reliability and Maintainability Symposium, pp. 181-188, January 1992.

Role of Failure-Mechanism Identification in Accelerated Testing

J. Hu, D. Barker, A. Dasgupta, and A. Arora
University of Maryland
College Park, MD 20742


Accelerated life testing techniques provide a shortcut method to investigate the reliability of electronic devices with respect to certain dominant failure mechanisms occurring under normal operating conditions. however, accelerated tests have often been conducted without knowledge of the failure mechanisms and without ensuring that the test accelerated the same mechanisms as that observed under normal operating conditions. This paper summarizes common failure mechanisms in electronic devices and packages and investigates possible failure mechanism shifting during accelerated testing.

Complete article is available to CALCE Consortium Members.

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