Proceedings 1992 Annual Reliability and Maintainability Symposium, pp. 181-188, January 1992.
J. Hu, D. Barker, A. Dasgupta, and A. Arora
University of Maryland
College Park, MD 20742
Accelerated life testing techniques provide a shortcut method to investigate
the reliability of electronic devices with respect to certain dominant
failure mechanisms occurring under normal operating conditions. however,
accelerated tests have often been conducted without knowledge of the failure
mechanisms and without ensuring that the test accelerated the same mechanisms
as that observed under normal operating conditions. This paper summarizes
common failure mechanisms in electronic devices and packages and investigates
possible failure mechanism shifting during accelerated testing.
article is available to CALCE Consortium Members.