A Physics Of Failure Approach To IC Burn-In
M. Pecht and P. Lall
Abstract:
Over the years the, the process of burn-in gas deteriorated into an
insurance policy to check reliability or satisfy customer imposed requirements.
Burn-in procedures are often conducted, without any prior verification
of the nature of the defects to be precipitated, the failure mechanisms
active in the device, their sensitivity to steady state temperature stress,
or any quantitative evidence of the improvement achieved by the process.
In fact, current failure data indicates that burn-in prior to usage does
not remove many failures and on the contrary may cause failures due to
additional handling. This paper examines the problems in the existing
burn-in methods and presents a physics of failure approach to burn-in.
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