Dual Function Distribution Of Failure In Ga-As Multi-Chip Microwave Monolithic Integrated Circuits (MMICs)
A. Christou, P. Tang and J. Hu
A definitive separation of bimodal failure distribution functions for
MMIC's has been obtained as a result of microwave accelerated life testing.
The circuit, which was a 28-GHz monolithic amplifier, showed a very strong
early failure pattern related only to passive component degradation.
Using the concept of multifunctional distribution it was possible to separate
the early failure pattern and to relate it to degradation of the off-chip
capacitors. The main failure distribution was active components.
If the data analysis included the early failures, a mean time to failure
(MTF) of less then 1x 105 h has been obtained.
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