Microelectronic Reliability/Temperature Independence
E. Hakim, M. Pecht and P. Lall
Steady state temperature conditions have been blamed for many failures
in electronic equipment. Thus, the lower the operating temperature
of equipment, the more reliable it will be. False! This paper
addresses the fact that failure mechanisms of microelectronic devices operating
in equipment designed and operated for a specific temperature range, i.
e., -55ºC to 125ºC, will not have microelectronic failures resulting
from steady state temperature failure mechanisms.
article is available to CALCE Consortium Members.