5th International Conference on Quality in Electronic Components, Bordeaux, France, pp. 49-54, October 7-10, 1991.

Microelectronic Reliability/Temperature Independence

E. Hakim, M. Pecht and P. Lall


Steady state temperature conditions have been blamed for many failures in electronic equipment.  Thus, the lower the operating temperature of equipment, the more reliable it will be.  False!  This paper addresses the fact that failure mechanisms of microelectronic devices operating in equipment designed and operated for a specific temperature range, i. e., -55ºC to 125ºC, will not have microelectronic failures resulting from steady state temperature failure mechanisms.

Complete article is available to CALCE Consortium Members.

[Home Page] [Articles Page]